HBM stands for Human Body Model, which is commonly known as the human discharge model in ESD electrostatic discharge. It characterizes the chip's anti-static ability, and electronic engineers know that the higher this parameter, the stronger the chip's anti-static ability. However, different chip suppliers usually select different testing standards based on their own understanding, experience, partner resources, or the applicable application scenarios of the chip. Different standards mean that there will be differences in testing methods or conditions, and it is not possible to directly compare the anti-static ability of the chip based on the HBM numbers marked in the specification sheet. At present, the commonly used testing standards for non automotive chips include ANSI/ESDA/JEDEC JS-001 and MIL-STD-883, while automotive chips will use the AEC Q100-002 standard. ANSI(American National Standards Institute)， The American National Standards Institute; ESDA(Electrostatic Discharge Association)， The American Electrostatic Discharge Association; JEDEC(Joint Electron Device Engineering Council)， The Solid State Technology Association; MIL-STD(US Military Standard)， That is, the US military emblem. Specific testing plans for HBM using these standards can be found online. Through comparison, it can be seen that the RC values selected for the three standard tests are all R=1.5k Ω C=100pF， There is no significant difference in the peak current and current waveform tested, but the number of pulses and the time interval between pulses tested are completely different
It can be seen that there is a huge difference in HBM data, because the influence of packaging materials on ESD parameters is very small, and the anti-static ability of chips under the same grain size should be comparable. The MIL-STD-883 standard is more stringent than the other two standards, and the test data will be even smaller. Of course, more strictly speaking, taking samples from the same batch and using different testing standards for testing will make the data more convincing. Comparison data provided by electronic enthusiasts can also be found online. In summary, MIL-STD-883 standard is the most stringent and the HBM data tested is smaller; The HBM data tested according to ANSI/ESDA/JEDEC JS-001 standard will be relatively large. It should be emphasized here that the standards followed for ESD testing of chips are completely different from those followed for ESD testing of whole machine products, and the energy level of static electricity is even more different. Therefore, it is not possible to directly use the ESD testing equipment of the whole machine to conduct ESD testing on chip pins. In system level circuit design, especially at external interfaces, special attention should be paid to anti-static and anti surge protection. These integrated chips are relatively delicate and cannot be expected to play the role of discrete protective devices.
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